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Coating Thickness Meter TT270
Product Introduction:
TT270 Coating Thickness Gauge can nondestructively measure the thickness of non-magnetic coatings (such as zinc, aluminum chrome, copper, rubber, paint and so on) on ferrous metals (such as steel, iron, alloyed metals, hard magnetic steel and so on). It can also measure the thickness of non-conducting coatings (such as rubber, paint, plastic, anode oxide film and so on) on the non-ferrous materials (such as copper, aluminum, zinc, tin and so on). It can fast, exactly and nondestructively measure the thickness of coating and plating.
Features
1. Adopts two measuring methods: magnetism induction (F) and eddy current (N). When F probe is equipped, it can measure the non-magnetic coating on magnetism substrate, when N probe is equipped, it can measure the non-conductive coating on non-magnetism substrate
2. Two measuring modes: continue/single
3. 6 types of probes are available for various application: F400, F1, F1/90º, F10, N1, CN02
4. Two working modes: direct mode (DIRECT) and Batch mode (APPL)
5. 5 statistical ways: Mean values/ Max.values/ Min.values/ Testing numbers(No.)/ Standard deviations (S.Dev)
6. Two measuring calibration modes
7. With backlight display
8. 640 measured values van be stored
9. Integrated with printer for convenient use
10. Low battery indication
11. 2 switch off modes: manual and auto
Technical Specification
1. Operation language: English/Chinese
2. Standards: DIN, ISO, ASTM, BS
3. Calibration: Zero and foil calibration
4. Interface: RS232
5. Statistics: Number of measurement, mean, standard deviation, maximum and minimum
6. Data memory: 640 readings
7. Limits: Adjustable with alarm
8. Power supply: NiMH rechargeable battery
9. Dimensions: 230x86x47mm
10. Operating environment: Temperature: 0~40ºC; Humidity: 20%~90%; No strong magnetic field
Probe model | F400 | F1 | F1/90º | F10 | N1 | CN02 | |||
Operating principle | Magnetic induction | Eddy current | |||||||
Measuring range (um) | 0~400 | 0~250 | 0~10000 | 0~1250um 0~40um (for chrome plate on copper) | 10~200 | ||||
Low range resolution (um) | 0.1 | 0.1 | 10 | 0.1 | 1 | ||||
Accuracy | One-point calibration (um) | ±(3%H+1) | ±(3%H+10) | ±(3%H+1.5) | ±(3%H+1) | ||||
Two-point calibration (um) | ±[(1~3)H%+0.7] | ±[(1~3)H%+1] | ±[(1~3)%H+10] | ±[(1~3)%H+1.5] | - | ||||
Measuring conditions | Min curvature of the min area (mm) | Convex | 1 | 1.5 | Flatten | 10 | 3 | Flatten | |
Diameter of the min area (mm) | φ3 | φ7 | φ7 | φ40 | φ5 | φ7 | |||
Critical thickness of substrate (mm) | 0.2 | 0.5 | 0.5 | 2 | 0.3 | unlimited |